Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852259 | Apparatus for X-ray inspection, and a method for manufacturing a semiconductor device using the same | Kyoung Hwan Lee, Sang Min Kim, Young-Hoon Sohn, Chi Hoon Lee | 2020-12-01 |
| 10593032 | Defect inspection method and defect inspection apparatus | Sung Yoon Ryu, Joon-Seo Song, Chung-Sam Jun, Yun-Jung Jee | 2020-03-17 |
| 10559506 | Method of inspecting semiconductor device | Min Kook Kim, Jun Chul Kim, Myung Suk Um, Ye Ny Yim | 2020-02-11 |
| 10527556 | Optical measuring method and apparatus, and method of manufacturing semiconductor device using the same | Min Ho Rim, Jung Soo Kim, Young-Hoon Sohn, Chung-Sam Jun, Yun-Jung Jee | 2020-01-07 |