Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852259 | Apparatus for X-ray inspection, and a method for manufacturing a semiconductor device using the same | Kyoung Hwan Lee, Sang Min Kim, Yu-Sin Yang, Chi Hoon Lee | 2020-12-01 |
| 10585115 | Scanning probe inspector | Duck Mahn Oh, Sung Yoon Ryu, Chung-Sam Jun, Yun-Jung Jee | 2020-03-10 |
| 10527556 | Optical measuring method and apparatus, and method of manufacturing semiconductor device using the same | Min Ho Rim, Jung Soo Kim, Yu-Sin Yang, Chung-Sam Jun, Yun-Jung Jee | 2020-01-07 |