Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852259 | Apparatus for X-ray inspection, and a method for manufacturing a semiconductor device using the same | Sang Min Kim, Young-Hoon Sohn, Yu-Sin Yang, Chi Hoon Lee | 2020-12-01 |
| 10551326 | Method for measuring semiconductor device | Hyo Hyeong Kang, Kang-Woong Ko, Sung Yoon Ryu, Gil-woo Song, Jae Hyung AHN +4 more | 2020-02-04 |