Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10593032 | Defect inspection method and defect inspection apparatus | Sung Yoon Ryu, Joon-Seo Song, Yu-Sin Yang, Yun-Jung Jee | 2020-03-17 |
| 10585115 | Scanning probe inspector | Duck Mahn Oh, Sung Yoon Ryu, Young-Hoon Sohn, Yun-Jung Jee | 2020-03-10 |
| 10527556 | Optical measuring method and apparatus, and method of manufacturing semiconductor device using the same | Min Ho Rim, Jung Soo Kim, Young-Hoon Sohn, Yu-Sin Yang, Yun-Jung Jee | 2020-01-07 |