Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10593032 | Defect inspection method and defect inspection apparatus | Sung Yoon Ryu, Yu-Sin Yang, Chung-Sam Jun, Yun-Jung Jee | 2020-03-17 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10593032 | Defect inspection method and defect inspection apparatus | Sung Yoon Ryu, Yu-Sin Yang, Chung-Sam Jun, Yun-Jung Jee | 2020-03-17 |