Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852337 | Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies | Sharad Saxena, Tomasz Brozek, Yuan Yu, Mike Kyu Hyon Pak | 2020-12-01 |
| 10643735 | Passive array test structure for cross-point memory characterization | Tomasz Brozek, Christopher Hess, Rakesh Vallishayee, Hendrik Schneider, Yuan Yu +2 more | 2020-05-05 |