Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852337 | Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies | Tomasz Brozek, Yuan Yu, Mike Kyu Hyon Pak, Meindert Martin Lunenborg | 2020-12-01 |
| 10641804 | Method for applying charge-based-capacitance-measurement with switches using only NMOS or only PMOS transistors | — | 2020-05-05 |
| 10529631 | Test structures and method for electrical measurement of FinFET fin height | Jianjun Cheng, Yuan Yu | 2020-01-07 |