Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852337 | Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies | Sharad Saxena, Tomasz Brozek, Yuan Yu, Meindert Martin Lunenborg | 2020-12-01 |