Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861671 | Method and system for focus adjustment of a multi-beam scanning electron microscopy system | Doug K. Masnaghetti, Richard R. Simmons, Mark A. McCord, Rainer Knippelmeyer | 2020-12-08 |
| 10733744 | Learning based approach for aligning images acquired with different modalities | Thanh Huy Ha, Mohan Mahadevan | 2020-08-04 |
| 10533954 | Apparatus and methods for combined brightfield, darkfield, and photothermal inspection | Lena Nicolaides, Mohan Mahadevan, Alex Salnik | 2020-01-14 |