Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10579772 | Computational wafer inspection | Christophe David Fouquet, Bernardo Kastrup, Arie Jeffrey Den Boef, Johannes Catharinus Hubertus Mulkens, James Benedict Kavanagh +1 more | 2020-03-03 |
| 10569469 | Model-based scanner tuning systems and methods | Yu Cao, Wenjin Shao, Ronaldus Johannes Gijsbertus Goossens, Jun Ye | 2020-02-25 |