Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10635004 | Correction using stack difference | Aiqin JIANG, Arie Jeffrey Den Boef, Kaustuve Bhattacharyya, Bart Visser, Martin Jacobus Johan Jak | 2020-04-28 |
| 10578982 | Substrate measurement recipe design of, or for, a target including a latent image | Mir Homayoun Shahrjerdy | 2020-03-03 |
| 10551750 | Metrology method and apparatus and associated computer product | Adam Jan URBANCZYK, Grzegorz Grzela, Alberto Da Costa Assafrao, Chien-Hung Tseng, Jay Jianhui Chen | 2020-02-04 |