Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10409171 | Overlay control with non-zero offset prediction | Michael Adel, Amnon Manassen, William Pierson, Ady Levy, Pradeep Subrahmanyan +4 more | 2019-09-10 |
| 10331050 | Lithography systems with integrated metrology tools having enhanced functionalities | Eran Amit, Roie Volkovich | 2019-06-25 |