Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10402688 | Data augmentation for convolutional neural network-based defect inspection | Bjorn Brauer, Vijay Ramachandran, Richard Wallingford | 2019-09-03 |
| 10360477 | Accelerating semiconductor-related computations using learning based models | Kris Bhaskar, Mark J. Roulo, Jing Zhang, Laurent Karsenti, Mohan Mahadevan +1 more | 2019-07-23 |
| 10325753 | Method and system for focus adjustment of a multi-beam scanning electron microscopy system | Doug K. Masnaghetti, Richard R. Simmons, Mark A. McCord, Rainer Knippelmeyer | 2019-06-18 |