Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10395362 | Contour based defect detection | Ajay Gupta, Sankar Venkataraman, Hedong Yang, Laurent Karsenti, Yair Carmon +2 more | 2019-08-27 |
| 10360477 | Accelerating semiconductor-related computations using learning based models | Kris Bhaskar, Scott A. Young, Mark J. Roulo, Jing Zhang, Laurent Karsenti +1 more | 2019-07-23 |
| 10290088 | Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput | Himanshu Vajaria, Tommaso Torelli, Bradley Ries | 2019-05-14 |