Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10474133 | Inspection device for inspecting wafer and method of inspecting wafer using the same | Yoo-jin Jeong, Sangbong Park, Byeonghwan Jeon | 2019-11-12 |
| 10275202 | Display device and command transmission method thereof | Youngkyu Jo | 2019-04-30 |
| 10269111 | Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same | Joonseo Song, Sung Yoon Ryu, Wahseng Yap, Yunjung Jee, Yusin Yang +3 more | 2019-04-23 |