Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10269111 | Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same | Joonseo Song, Wahseng Yap, Yunjung Jee, Yusin Yang, Chungsam Jun +3 more | 2019-04-23 |
| 10249544 | Method of inspecting surface and method of manufacturing semiconductor device | Chung-Sam Jun, Yu-Sin Yang, Yun-Jung Jee, Gil-woo Song | 2019-04-02 |