Issued Patents 2019
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10410937 | Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurement | Jang-Ik Park, Bong Seok Kim, Souk Kim, Soo Seok Lee | 2019-09-10 |
| 10373796 | Method of inspecting wafer using electron beam | Souk Kim, Chung-Sam Jun, Woo-Seok Ko, Sang-Kil Lee, Kwang Il Shin +1 more | 2019-08-06 |
| 10281410 | Systems and methods of testing semiconductor devices using simultaneously scanning of a plurality of regions therein and methods of forming semiconductor devices using the same | Min Ho Rim, Chung-Sam Jun, Yun-Jung Jee | 2019-05-07 |
| 10249544 | Method of inspecting surface and method of manufacturing semiconductor device | Sung Yoon Ryu, Chung-Sam Jun, Yun-Jung Jee, Gil-woo Song | 2019-04-02 |
| 10222414 | Apparatus and method for exchanging probe | Jae Wan Hong, Jeong Hoi Kim, Sang-Kil Lee, Chung-Sam Jun | 2019-03-05 |