Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10269111 | Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same | Sung Yoon Ryu, Wahseng Yap, Yunjung Jee, Yusin Yang, Chungsam Jun +3 more | 2019-04-23 |