Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10482593 | Inspection method, inspection system, and method of manufacturing semiconductor package using the same | Younghoon Sohn | 2019-11-19 |
| 10460436 | Inspection method, inspection system, and method of fabricating semiconductor package using the same | Younghoon Sohn, Ilsoo Kim | 2019-10-29 |
| 10393672 | System and method of inspecting substrate and method of fabricating semiconductor device using the same | Jeongho Ahn, Jae-Man Oh, Seongsil Lee, Dongchul Ihm, Hyungsuk Cho | 2019-08-27 |
| 10269111 | Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same | Joonseo Song, Sung Yoon Ryu, Wahseng Yap, Yunjung Jee, Chungsam Jun +3 more | 2019-04-23 |