Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10482593 | Inspection method, inspection system, and method of manufacturing semiconductor package using the same | Yusin Yang | 2019-11-19 |
| 10460436 | Inspection method, inspection system, and method of fabricating semiconductor package using the same | Ilsoo Kim, Yusin Yang | 2019-10-29 |