Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10393672 | System and method of inspecting substrate and method of fabricating semiconductor device using the same | Jeongho Ahn, Jae-Man Oh, Yusin Yang, Dongchul Ihm, Hyungsuk Cho | 2019-08-27 |