Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10474133 | Inspection device for inspecting wafer and method of inspecting wafer using the same | Janghee Lee, Sangbong Park, Byeonghwan Jeon | 2019-11-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10474133 | Inspection device for inspecting wafer and method of inspecting wafer using the same | Janghee Lee, Sangbong Park, Byeonghwan Jeon | 2019-11-12 |