Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 10475629 | Charged-particle microscope with in situ deposition functionality | Rudolf Johannes Peter Gerardus Schampers, Michal Hrouzek, Tomas Gardelka | 2019-11-12 | $2,973,000 |
| 10170275 | Cryogenic specimen processing in a charged particle microscope | Tomá{hacek over (s)} Vystav{hacek over (e)}l, Martin Cafourek | 2019-01-01 |