TG

Tomas Gardelka

FE Fei: 1 patents #19 of 103Top 20%
📍 Vyškov, CZ: #1 of 2 inventorsTop 50%
Overall (2019): #240,362 of 560,194Top 45%
1
Patents 2019

Issued Patents 2019

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10475629 Charged-particle microscope with in situ deposition functionality John Mitchels, Rudolf Johannes Peter Gerardus Schampers, Michal Hrouzek 2019-11-12