RS

Rudolf Johannes Peter Gerardus Schampers

FE Fei: 1 patents #19 of 103Top 20%
📍 Tegelen, NL: #2 of 3 inventorsTop 70%
Overall (2019): #289,162 of 560,194Top 55%
1
Patents 2019

Issued Patents 2019

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10475629 Charged-particle microscope with in situ deposition functionality John Mitchels, Michal Hrouzek, Tomas Gardelka 2019-11-12