MH

Michal Hrouzek

FE Fei: 1 patents #19 of 103Top 20%
Overall (2019): #343,622 of 560,194Top 65%
1
Patents 2019

Issued Patents 2019

Patent #TitleCo-InventorsDate
10475629 Charged-particle microscope with in situ deposition functionality John Mitchels, Rudolf Johannes Peter Gerardus Schampers, Tomas Gardelka 2019-11-12