Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10504689 | Method for sample orientation for TEM lamella preparation | Libor Strako{hacek over (s)}, Anna Prokhodtseva, Jaromir Va{hacek over (n)}hara, Jaroslav Stárek | 2019-12-10 |
| 10170275 | Cryogenic specimen processing in a charged particle microscope | John Mitchels, Martin Cafourek | 2019-01-01 |