Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10025285 | On-product derivation and adjustment of exposure parameters in a directed self-assembly process | Eran Amit, Nuriel Amir, Michael Adel | 2018-07-17 |
| 9934353 | Focus measurements using scatterometry metrology | Mohamed El Kodadi, Nuriel Amir, Vladimir Levinski, Yoel Feler, Daniel Kandel +3 more | 2018-04-03 |