Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10025285 | On-product derivation and adjustment of exposure parameters in a directed self-assembly process | Roie Volkovich, Nuriel Amir, Michael Adel | 2018-07-17 |
| 9874527 | Removing process-variation-related inaccuracies from scatterometry measurements | Zeev Bomzon, Barak Bringoltz, Boris Efraty | 2018-01-23 |