Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9934353 | Focus measurements using scatterometry metrology | Nuriel Amir, Roie Volkovich, Vladimir Levinski, Yoel Feler, Daniel Kandel +3 more | 2018-04-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9934353 | Focus measurements using scatterometry metrology | Nuriel Amir, Roie Volkovich, Vladimir Levinski, Yoel Feler, Daniel Kandel +3 more | 2018-04-03 |