Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10128080 | Three-dimensional imaging in charged-particle microscopy | Faysal Boughorbel, Ingo Gestmann | 2018-11-13 |
| 10115561 | Method of analyzing surface modification of a specimen in a charged-particle microscope | Faysal Boughorbel, Mathijs Petrus Wilhelmus van den Boogaard, Emine Korkmaz | 2018-10-30 |
| 10002742 | Composite scan path in a charged particle microscope | Cornelis Sander Kooijman, Hendrik Jan de Vos, Hendrik Nicolaas Slingerland | 2018-06-19 |
| 9934936 | Charged particle microscope with special aperture plate | Franciscus Martinus Henricus Maria van Laarhoven, Faysal Boughorbel, Remco Schoenmakers, Peter Christiaan Tiemeijer | 2018-04-03 |