CK

Cornelis Sander Kooijman

FE Fei: 2 patents #11 of 107Top 15%
Overall (2018): #157,745 of 503,207Top 35%
2
Patents 2018

Issued Patents 2018

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10002742 Composite scan path in a charged particle microscope Pavel Potocek, Hendrik Jan de Vos, Hendrik Nicolaas Slingerland 2018-06-19
9865427 User interface for an electron microscope Martinus P. M. Bierhoff, Bart Buijsse, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more 2018-01-09