HV

Hendrik Jan de Vos

FE Fei: 1 patents #23 of 107Top 25%
Overall (2018): #401,873 of 503,207Top 80%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10002742 Composite scan path in a charged particle microscope Pavel Potocek, Cornelis Sander Kooijman, Hendrik Nicolaas Slingerland 2018-06-19