Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10128080 | Three-dimensional imaging in charged-particle microscopy | Pavel Potocek, Ingo Gestmann | 2018-11-13 |
| 10115561 | Method of analyzing surface modification of a specimen in a charged-particle microscope | Pavel Potocek, Mathijs Petrus Wilhelmus van den Boogaard, Emine Korkmaz | 2018-10-30 |
| 9934936 | Charged particle microscope with special aperture plate | Pavel Potocek, Franciscus Martinus Henricus Maria van Laarhoven, Remco Schoenmakers, Peter Christiaan Tiemeijer | 2018-04-03 |