Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157727 | Aberration measurement in a charged particle microscope | Alexander Henstra | 2018-12-18 |
| 9991087 | Spectroscopy in a transmission charged-particle microscope | Erwin de Jong, Sorin Lazar, Rudolf Geurink | 2018-06-05 |
| 9978561 | Post column filter with enhanced energy range | Alexander Henstra | 2018-05-22 |
| 9934936 | Charged particle microscope with special aperture plate | Pavel Potocek, Franciscus Martinus Henricus Maria van Laarhoven, Faysal Boughorbel, Remco Schoenmakers | 2018-04-03 |