EK

Emine Korkmaz

FE Fei: 1 patents #23 of 107Top 25%
Overall (2018): #427,151 of 503,207Top 85%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10115561 Method of analyzing surface modification of a specimen in a charged-particle microscope Pavel Potocek, Faysal Boughorbel, Mathijs Petrus Wilhelmus van den Boogaard 2018-10-30