Issued Patents 2017
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9804197 | Evaluation apparatus and probe position inspection method | Norihiro Takesako, Akira Okada | 2017-10-31 |
| 9684015 | Measuring apparatus and measuring method utilizing insulating liquid | Akira Okada, Kosuke Hatozaki | 2017-06-20 |
| 9684027 | Measuring apparatus | Akira Okada, Takayuki Shirotori | 2017-06-20 |
| 9678143 | Semiconductor evaluation apparatus | Akira Okada, Norihiro Takesako, Kinya YAMASHITA, Hajime Akiyama | 2017-06-13 |
| 9659795 | Foreign matter removal device and foreign matter removal method | Akira Okada, Hajime Akiyama | 2017-05-23 |
| 9562929 | Measurement device | Akira Okada, Norihiro Takesako | 2017-02-07 |