Issued Patents 2017
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9804197 | Evaluation apparatus and probe position inspection method | Norihiro Takesako, Takaya Noguchi | 2017-10-31 |
| 9720014 | Semiconductor evaluation apparatus and semiconductor evaluation method | Kosuke Hatozaki, Kinya YAMASHITA | 2017-08-01 |
| 9722060 | Semiconductor device and semiconductor module | Hiroyuki Nakamura, Eiji Nojiri | 2017-08-01 |
| 9684015 | Measuring apparatus and measuring method utilizing insulating liquid | Takaya Noguchi, Kosuke Hatozaki | 2017-06-20 |
| 9684027 | Measuring apparatus | Takaya Noguchi, Takayuki Shirotori | 2017-06-20 |
| 9678143 | Semiconductor evaluation apparatus | Takaya Noguchi, Norihiro Takesako, Kinya YAMASHITA, Hajime Akiyama | 2017-06-13 |
| 9659795 | Foreign matter removal device and foreign matter removal method | Takaya Noguchi, Hajime Akiyama | 2017-05-23 |
| 9568380 | Torque sensor and manufacturing method therefor | Shuntaro Yoshida, Takao Iwaki, Inao Toyoda, Takuya Ishikawa, Kazumasa Ogino | 2017-02-14 |
| 9562929 | Measurement device | Takaya Noguchi, Norihiro Takesako | 2017-02-07 |
| 9551745 | Semiconductor device assessment apparatus | Hajime Akiyama, Kinya YAMASHITA | 2017-01-24 |