Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9804197 | Evaluation apparatus and probe position inspection method | Akira Okada, Takaya Noguchi | 2017-10-31 |
| 9678143 | Semiconductor evaluation apparatus | Akira Okada, Takaya Noguchi, Kinya YAMASHITA, Hajime Akiyama | 2017-06-13 |
| 9562929 | Measurement device | Takaya Noguchi, Akira Okada | 2017-02-07 |