Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9720014 | Semiconductor evaluation apparatus and semiconductor evaluation method | Akira Okada, Kosuke Hatozaki | 2017-08-01 |
| 9678143 | Semiconductor evaluation apparatus | Akira Okada, Takaya Noguchi, Norihiro Takesako, Hajime Akiyama | 2017-06-13 |
| 9551745 | Semiconductor device assessment apparatus | Hajime Akiyama, Akira Okada | 2017-01-24 |