Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9720014 | Semiconductor evaluation apparatus and semiconductor evaluation method | Akira Okada, Kinya YAMASHITA | 2017-08-01 |
| 9684015 | Measuring apparatus and measuring method utilizing insulating liquid | Akira Okada, Takaya Noguchi | 2017-06-20 |