Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9702829 | Systems and methods for wafer surface feature detection and quantification | Jaydeep Sinha, Sergey Kamensky, Enrique Chavez, Shouhong Tang, Mark Plemmons | 2017-07-11 |
| 9646379 | Detection of selected defects in relatively noisy inspection data | Michael D. Kirk, Stephen Biellak, Jaydeep Sinha | 2017-05-09 |
| 9632038 | Hybrid phase unwrapping systems and methods for patterned wafer measurement | Jaydeep Sinha | 2017-04-25 |
| 9546862 | Systems, methods and metrics for wafer high order shape characterization and wafer classification using wafer dimensional geometry tool | Jaydeep Sinha, Sergey Kamensky, Sathish Veeraraghavan, Pradeep Vukkadala | 2017-01-17 |