Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9702829 | Systems and methods for wafer surface feature detection and quantification | Haiguang Chen, Jaydeep Sinha, Sergey Kamensky, Enrique Chavez, Mark Plemmons | 2017-07-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9702829 | Systems and methods for wafer surface feature detection and quantification | Haiguang Chen, Jaydeep Sinha, Sergey Kamensky, Enrique Chavez, Mark Plemmons | 2017-07-11 |