| 9818542 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad |
2017-11-14 |
| 9704852 |
Electrostatic discharge and passive structures integrated in a vertical gate fin-type field effect diode |
Robert J. Gauthier, Jr., Tom C. Lee, You Li, Rahul Mishra, Andreas Scholze |
2017-07-11 |
| 9620497 |
Structure and method for dynamic biasing to improve ESD robustness of current mode logic (CML) drivers |
James P. Di Sarro, Robert J. Gauthier, Jr., Nathan Jack, Junjun Li |
2017-04-11 |
| 9590108 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad |
2017-03-07 |
| 9575115 |
Methodology of grading reliability and performance of chips across wafer |
Nathaniel R. Chadwick, James P. Di Sarro, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li +2 more |
2017-02-21 |
| 9536870 |
SCR with fin body regions for ESD protection |
James P. Di Sarro, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Christopher S. Putnam |
2017-01-03 |
