Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9726617 | Apparatus and methods for finding a best aperture and mode to enhance defect detection | Pavel Kolchin, Lisheng Gao, Grace Hsiu-Ling Chen, Markus Huber, Robert M. Danen | 2017-08-08 |