Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9816940 | Wafer inspection with focus volumetric method | Grace Hsiu-Ling Chen, Keith Wells, Se Baek Oh | 2017-11-14 |
| 9726617 | Apparatus and methods for finding a best aperture and mode to enhance defect detection | Pavel Kolchin, Richard Wallingford, Lisheng Gao, Grace Hsiu-Ling Chen, Robert M. Danen | 2017-08-08 |