Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9816940 | Wafer inspection with focus volumetric method | Grace Hsiu-Ling Chen, Keith Wells, Markus Huber | 2017-11-14 |
| 9684282 | System, method and apparatus for wavelength-coded multi-focal microscopy | George Barbastathis, Yuan Luo | 2017-06-20 |