| 9754847 |
Circuit probing structures and methods for probing the same |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin |
2017-09-05 |
| 9739865 |
Identification method and identification system for an object's passing route direction |
Jian Wu, Jianqiang Zeng |
2017-08-22 |
| 9671457 |
3D IC testing apparatus |
Mill-Jer Wang, Chih-Chia Chen, Hung-Chih Lin, Ching-Nen Peng |
2017-06-06 |
| 9664707 |
Testing holders for chip unit and die package |
Mill-Jer Wang, Kuo-Chuan Liu, Ching-Nen Peng, Hung-Chih Lin |
2017-05-30 |
| 9658281 |
Alignment testing for tiered semiconductor structure |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Mincent Lee |
2017-05-23 |
| 9653927 |
Composite integrated circuits and methods for wireless interactions therewith |
Min-Jer Wang, Ching-Nen Peng, Chewn-Pu Jou, Feng-Wei Kuo, Hung-Chih Lin +4 more |
2017-05-16 |
| 9640447 |
Test circuit and method |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Chung-Han Huang |
2017-05-02 |
| 9606155 |
Capacitance measurement circuit and method |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Chung-Han Huang |
2017-03-28 |
| 9568543 |
Structure and method for testing stacked CMOS structure |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin |
2017-02-14 |
