Issued Patents 2017
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9799747 | Low resistance contact for semiconductor devices | Joel P. de Souza, Keith E. Fogel, Jeehwan Kim, Devendra K. Sadana | 2017-10-24 |
| 9754969 | Dual-material mandrel for epitaxial crystal growth on silicon | Sanghoon Lee, Effendi Leobandung | 2017-09-05 |
| 9748412 | Highly responsive III-V photodetectors using ZnO:Al as N-type emitter | Jeehwan Kim, Ning Li, Devendra K. Sadana | 2017-08-29 |
| 9739728 | Automatic defect detection and classification for high throughput electron channeling contrast imaging | Stephen W. Bedell, Renee T. Mo, Kunal Mukherjee, John A. Ott, Devendra K. Sadana | 2017-08-22 |
| 9741532 | Multi-beam electron microscope for electron channeling contrast imaging of semiconductor material | Stephen W. Bedell, Kunal Mukherjee, John A. Ott, Devendra K. Sadana | 2017-08-22 |
| 9698239 | Growing groups III-V lateral nanowire channels | Sanghoon Lee, Effendi Leobandung, Renee T. Mo | 2017-07-04 |
| 9653570 | Junction interlayer dielectric for reducing leakage current in semiconductor devices | Joel P. de Souza, Keith E. Fogel, Jeehwan Kim, Devendra K. Sadana | 2017-05-16 |
| 9647063 | Nanoscale chemical templating with oxygen reactive materials | Maha M. Khayyat, Devendra K. Sadana | 2017-05-09 |
| 9583562 | Reduction of defect induced leakage in III-V semiconductor devices | Joel P. de Souza, Jeehwan Kim, Devendra K. Sadana | 2017-02-28 |
| 9564494 | Enhanced defect reduction for heteroepitaxy by seed shape engineering | Cheng-Wei Cheng, David L. Rath, Devendra K. Sadana, Kuen-Ting Shiu | 2017-02-07 |
| 9553153 | Post growth defect reduction for heteroepitaxial materials | John A. Ott, Devendra K. Sadana | 2017-01-24 |