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Stephen W. Bedell, Renee T. Mo, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser |
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| 9741532 |
Multi-beam electron microscope for electron channeling contrast imaging of semiconductor material |
Stephen W. Bedell, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser |
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Method of forming high-germanium content silicon germanium alloy fins on insulator |
Pouya Hashemi, Renee T. Mo, Alexander Reznicek |
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Polarization free gallium nitride-based photonic devices on nanopatterned silicon |
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Gallium nitride material and device deposition on graphene terminated wafer and method of forming the same |
Can Bayram, Christos D. Dimitrakopoulos, Keith E. Fogel, Jeehwan Kim, Devendra K. Sadana |
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| 9553153 |
Post growth defect reduction for heteroepitaxial materials |
Devendra K. Sadana, Brent A. Wacaser |
2017-01-24 |
